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Testing Center
Testing Center
  • ●  R&D experiments of electronic materials
  • ●  Electric performance test of electronics
  • ●  Reliability tests
  • ●  Failure analysis of electron components
  • ●  Microstructure analysis
  • ●  X-ray Test System (CT)
  • ●  SEM/EDS
  • ●  X-ray Fluorescence Spectrometer (XRF)
  • ●  Automatic Polishing Machine
  • ●  Impedance Analyzer
  • ●  Microhmmeter
  • ●  LCR Tester
  • ●  B-H Analyzer
  • ●  Permanent Magnetic Property Measuring Instrument
  • ●  Withstand Voltage Tester
  • ●  Surface Magnetic Field Distribution Measuring Instrument
  • ●  Package Vibration Test
  • ●  Package Dropping Test
  • ●  Board Bending Test
  • ●  Terminal Strength Test
  • ●  Vibration Test
  • ●  Mechanical Shock Test
  • ●  Solderability Test
  • ●  Welding Heat Resistance Test
  • ●  Steam Aging Test
  • ●  Neutral Salt Spray Test
  • ●  Steady State Temperature Humidity Bias Life Test
  • ●  Loading At High Temperature(Life Test)
  • ●  Low Temperature Storage Test 
  • ●  Temperature Characteristics Test
  • ●  Change Of Temperature Test 
  • ●  High Temperature Storage Test 
  • ●  Characterization, element analysis